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                En

                Final Test
                Final Test

                Next Generation Test Cell 

                In a primitive form of Final Test, a test cell is composed of a handler, a tester and a tester workstation that communicates with the handler over a GPIB, parallel or serial communications interface. Within this test cell, an operator divides his time between multiple testers, performing many tasks and, when or if time allows, checks whether any testers are running out-of-control.

                In contrast, JCET has evolved to a Next Generation Test Cell that includes an Automatic Test Cell Controller and a Tester Utilization Tracking System connected to the communications interface between tester 

                and handler that monitors all the activity between tester and handler (see photo below).


                Real-Time Monitoring and Control

                The Tester Utilization Tracking System automatically captures the actual, real-time tester utilization where productive time is actual test time + actual index time and all other time is a category of waste. Utilization trends are displayed on a utilization monitor next to the tester workstation.

                At the same time, the Automatic Test Cell Controller is continuously monitoring the good yield, the yield variation between test sites and the failure rates for all hard and soft bins looking for pre-defined out-of-control events. When it detects an out-of-control event, the Auto Controller automatically stops the tester and activates an alarm to immediately bring line support technicians into the test cell to fix the problem.

                This Next Generation Test Cell also includes a scanner to avoid manual entry mistakes. Test hardware used in production at JCET is bar-coded along with the Lot ID on the Lot Traveler.

                Automatic Closed Loop Process Control

                This Next Generation Test Cell enables automatic closed loop process control, which JCET utilizes to keep test manufacturing processes under control at all times.

                Handler Equipment

                At the core of a Final Test cell is a test platform and a handler. The following table highlights the primary handling equipment used for Final Test atJCET.


                 

                 Temperature   Capability

                 Range 

                 Handler Manufacturers

                 Models

                 Pick and Place

                 Ambient to Hot


                 Seiko Epson

                 Northstar series


                 Ambient to Hot


                 Synax

                 SX series


                 Ambient to Hot


                 Delta Design 

                 Delta EDGE


                 Ambient to Hot


                 Hontech

                 HT9045W


                 Tri-Temp


                 Multitest

                 MT 9510


                 Tri-Temp

                 -60 oC to 160 oC 

                 Delta Design 

                 Delta Castle


                 Tri-Temp


                 Synax

                 SX141C

                 Gravity Feed 

                 Ambient to Hot


                 Multitest

                 MT8, MT9 series


                 Ambient to Hot  


                 MCT

                 3608


                 Ambient to Hot  


                 Symtek

                 300 series


                 Tri-Temp  


                 Multitest

                 MT8, MT9 series


                 Tri-Temp 

                 -60 oC to 160 oC  

                 Rasco

                 SO series


                 Tri-Temp


                 Aseco

                 S series

                 Turret

                 Ambient


                 SRM

                 XD series

                 High Parallel Memory Test

                 Tri-Temp


                 Mirae

                 M440

                 High Parallel Strip Test 

                 Ambient


                 TESEC 

                 3270-IHR

                 System Level Test 

                 Ambient to Hot

                 25 oC to 125 oC  

                 Chroma

                 3620*




                 Hontech

                 3000

                Other types of handling equipment are available at JCET factories to satisfy special customer requests. Contact JCET to request other handlers not highlighted in the table.

                Small Package Handling

                For package body sizes less than 3×3 mm, JCET recommends either a turret handling solution or a strip test solution. JCET’s turret handlers integrate tape and reel creating a continuous manufacturing flow from Final Test into Post Test to improve throughput.

                Burn-In Services

                JCET offers sophisticated Burn-In systems with deep vector memory for dynamic Burn-In. Vector memory enables high fault coverage during the Burn-In process. JTAG testing and boundary scan can also be performed during Burn-In.

                JCET has established close working relationships with subcontractors whose core business is Burn-In. By extending its Burn-In capabilities to include outside Burn-In specialists, JCET can take advantage of proprietary technology, techniques and Burn-In patterns from these vendors to satisfy any special customer requirements.

                JCET also provides services for design and development of Burn-In boards and vector memory patterns for dynamic Burn-In.

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                保留一切權利
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