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                High-End Digital Test
                High-End Digital Test

                Digital Test

                JCET is experienced in testing high-end devices of all types. Our engineers work with customers to develop the right test solution for their device and then optimize it for robust high-volume production.

                Because of our focus on high-end devices, JCET has a large number of testers with high number of digital channels. We have digital test platforms with over 1200 digital channels that can support high parallel testing of digital devices. These test platforms can be expanded further with additional digital channels to enable even more test sites and attain even higher levels of parallel testing.

                 Teradyne 

                 Advantest

                 LTXC

                 Digital & Mixed Signal

                 ultraFLEX

                 iFLEX

                 J750

                 Catalyst

                 PS400

                 PS800

                 PS1600

                 T2000(GEN1,EPP)

                 Fusion CX

                Primary test platforms available at JCET for Digital Testing
                聯系我們 |  客戶查詢 |  法律聲明

                聯系我們 客戶查詢 法律聲明

                版權所有@江蘇長電科技股份有限公」司 保留一切權利 蘇ICP備05082751號-132028102000607

                版權所有@江咋了蘇長電科技股份有限公司
                保留一切權利
                蘇ICP備05082751號-1 32028102000607