• <tr id='cr6Mbo'><strong id='cr6Mbo'></strong><small id='cr6Mbo'></small><button id='cr6Mbo'></button><li id='cr6Mbo'><noscript id='cr6Mbo'><big id='cr6Mbo'></big><dt id='cr6Mbo'></dt></noscript></li></tr><ol id='cr6Mbo'><option id='cr6Mbo'><table id='cr6Mbo'><blockquote id='cr6Mbo'><tbody id='cr6Mbo'></tbody></blockquote></table></option></ol><u id='cr6Mbo'></u><kbd id='cr6Mbo'><kbd id='cr6Mbo'></kbd></kbd>

    <code id='cr6Mbo'><strong id='cr6Mbo'></strong></code>

    <fieldset id='cr6Mbo'></fieldset>
          <span id='cr6Mbo'></span>

              <ins id='cr6Mbo'></ins>
              <acronym id='cr6Mbo'><em id='cr6Mbo'></em><td id='cr6Mbo'><div id='cr6Mbo'></div></td></acronym><address id='cr6Mbo'><big id='cr6Mbo'><big id='cr6Mbo'></big><legend id='cr6Mbo'></legend></big></address>

              <i id='cr6Mbo'><div id='cr6Mbo'><ins id='cr6Mbo'></ins></div></i>
              <i id='cr6Mbo'></i>
            1. <dl id='cr6Mbo'></dl>
              1. <blockquote id='cr6Mbo'><q id='cr6Mbo'><noscript id='cr6Mbo'></noscript><dt id='cr6Mbo'></dt></q></blockquote><noframes id='cr6Mbo'><i id='cr6Mbo'></i>

                En

                RF Test
                RF Test

                Leadership in RF Testing

                As wireless communication standards rapidly evolve with new protocols, test requirements have become far more complex. JCET has extensive test experience across the entire spectrum of RF devices–from simple RF transceivers to the most complex RF networking or mobile phone devices.

                Advanced RF devices often require multiple test stages at both Wafer Level and Final Test. Our RF test capabilities are designed to maximize and stabilize first pass and final yields at each RF test stage. We also have Known Good Die (KGD) test strategies that enable our customers to minimize both test costs and test losses when testing these advanced RF packages and devices.   With the growing trend toward miniaturization, testing RF products becomes more challenging due the integration of RF components with any digital or baseband component to create an RF System-in-Package with extremely small dimensions. Youcan rely on our comprehensive RF packaging and test experience to deliver the best solution for your application.


                 Teradyne
                 Advantest
                 LTXC
                 RF        UltraFLEX
                 iFLEX
                 Catalyst
                 PS800
                 PS1600
                 Fusion CX

                                                                                            Primary test platforms available at JCET for RF Test


                聯系我們 |  客戶查詢 |  法律聲明

                聯系我們 客戶查詢 法律聲明

                版權所有@江蘇長電科技股份●有限公司 保留一切權利≡ 蘇ICP備05082751號-132028102000607

                版權所有@江分别朝三人急速飞窜了过来蘇長電科技股份有限公司
                保留一切權利
                蘇ICP備05082751號-1 32028102000607