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                En

                Test Development Services
                Test Development Services

                JCET provides customers with test development and test program migration services.  Our capabilities include:

                ? Design for Manufacturing (DFM) consultation
                ? Test program development, debug and validation
                ? Device characterization
                ? First silicon characterization (wafer test)
                ? Test program optimization including test time optimization
                ? Probe card design, fabrication and qualification (wafer test)
                ? Load board design, fabrication and qualification (final test)
                ? Design, fabrication and qualification of any other interfacing hardware (final test)
                ? Multi-site migration to higher parallel testing
                ? Test program migration to a different test platform

                Included with these services are any test program changes required to rapidly maximize and stabilize first pass yields for high volume production.

                Test Development Flow



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                聯系我們 客戶查詢 法律聲明

                版權所有@江蘇長電科技股份╱有限公司 保留一切權利 蘇ICP備05082751號-132028102000607

                版權所有@江蘇黑暗骑师長電科技股份有限公司
                保留一切權利
                蘇ICP備05082751號-1 32028102000607